2D magnetic heterostructures: Spintronics and quantum future B Zhang, P Lu, R Tabrizian, PXL Feng, Y Wu npj spintronics
Revealing Bulk Trap Distributions in GaN MESFETs through Re-defined AC-Gₘ Characterization Method under Irradiation and Stress B Zhang, X Zhao, D Cornigli, J Song, Y Du, MA Villena,... IEEE International Reliability Physics Symposium (IRPS)
Can High-Temperature PBTI Testing Predict Dual-Gated ITO FET Long-term Reliability? MS Rahman, D Matthews, B Zhang, HF Hishe, MA Villena, J Chen, ... IEEE International Electron Devices Meeting (IEDM)
AC Transconductance (AC-Gm) Method for Spatial and Energy Profiling of Bulk Traps in GaN MESFETs B Zhang, X Zhao, A Harrison, J Song, Y Du, R Chu, T Roy Device Research Conference (DRC)
Low Frequency Electronic Noise Characterization of Au-W/β-Ga2O3 Schottky Diodes B Zhang, Y Chen, M Xian, F Ren, SJ Pearton, G Bosman, A Ural Electrochemical Society Meeting Abstracts (ECS)
